E1413C AGILENT high-speed 64 channel scanning A/D converter

Product Description

The E1413C AGILENT high-speed 64 channel scanning A/D converter converts analog signals into digital signals.

feature

Single person VXI module

64 channel high-speed A/D converter

100k/s sample

8 SCP module slots

E1413C is a 64 channel high-speed scanning analog-to-digital converter with optional signal conditioning per channel in a single width Vxi bus module.They scan up to 100000 channels per second,while automatically adjusting and converting readings to engineering units(EU).The read stream is routed to a 65024 read FIFO buffer,and the latest read from each of the 64 channels can be quickly accessed from the current value table(CVT).All readings are returned to FIFO and CFT in IEEE754,32-bit floating-point format or EU conversion,or as input voltage.Channel selection is controlled by four scan lists,each of which can contain up to 1024 channel assignments.Another list called”Checklist List”can reference each scan list(1 to 4 times)up to 1024 times.E1413 also provides an onboard calibration source for online,single command,and full channel calibration.This module can also compensate for system wiring compensation.E1413 can accept up to eight mixed signal conditioning power supplies ONS(SCPS).All of these functions can be accessed through SCCI and compiling the SCCI instrument language.

The E1413C AGILENT high-speed 64 channel scanning A/D converter is a high-performance data acquisition device with features such as high speed,multi-channel,and scanning capabilities.

The E1413C AGILENT high-speed 64 channel scanning A/D converter adopts advanced conversion technology,which has the characteristics of high precision,low noise,and low distortion,ensuring that the converted digital signal has high quality restoration.

application area

The E1413C AGILENT high-speed 64 channel scanning A/D converter is used in applications that require high-speed,multi-channel data acquisition and conversion,such as communication,medical,testing and measurement fields.